TY  - BOOK
A1  - Glaz, J.
A1  - Pozdnyakov, V.
A1  - Wallenstein, S.
T1  - Applications of Spatial Scan Statistics: A Review
Y1  - 2009
CY  - Boston, MA
PB  - Springer/Birkhüse
T3  - Statistics for Industry and Technology

ER  -