TY  - JOUR
A1  - Yau, K.K.W.
T1  - Multilevel Models for Survival Analysis with Random Effects
Y1  - 2001
DO  - 10.1111/j.0006-341X.2001.00096.x
JF  - Biometrics
VL  - 57
IS  - 1
SP  - 96
EP  - -102

ER  -